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Template Check and Block Matching Method for Automatic Defects Detection of the Back Light Unit
Chang Ho Han , Sang Hee Cho , Choon Suk Oh , Young Kee Ryu The KIPS Transactions:PartB ,
Vol. 13, No. 4, pp. 377-382,
Aug.
2006
10.3745/KIPSTB.2006.13.4.377
10.3745/KIPSTB.2006.13.4.377
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Vol. 1, 2012
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